Langer EMV-Technik is in the forefront of research, development, and production in the field of EMC.
Our interference emission and interference immunity EMC measurement technology as well as the IC test system are used mainly in the development stage and are in worldwide demand.
Developers and designers gain new perspectives and more efficient working strategies for module- and IC developments with the EMC know how and measurement technology of Langer EMV-Technik GmbH.
The individual pre-compliance consulting services provided by Langer EMV-Technik GmbH help developers and designers quickly find solutions to complex EMC problems in IC, device, and module development.
The mini burst field generators are particularly small. They are used to identify and eliminate weak points in electronic assemblies in the development phase. They generate a burst or an ESD field at their tip.
The ICI 03 L-EFT set consists of three different ICI sources emitting electric, magnetic field and current pulses. This allows high precision and very high resolution IC analysis and body bias injection. These sources allow side channel analysis e.g. to test security-critical circuits.
The ICS 105 IC scanner allows for measurements of high-frequency near fields above IC or DIE. Depending on the used ICR near-field microprobe magnetic or electric fields can be measured with a measuring resolution of 50 to 100 µm.
P23 set E-Mini Burst Field Generator
The P23`s interference pulse runs through and couples to the digital IC inputs under test, like Reset, Clock, Quartz or the respective signal lines. The extremly thin tip of P23 is suitable for testing finest structures.
ICI HH500-15 L-EFT Pulse Magnetic Field Source
The ICI HH500-15 L-EFT pulse magnetic field source couples fast transient pulses into a test IC (open die). This allows for side channel analysis or testing the immunity of individual areas of the IC.
ICS 105 set IC Scanner 4-Axis Positioning System
The ICS 105 IC scanner allows for measurements of high-frequency near fields above ICs. Depending on the used ICR near-field microprobe magnetic or electric fields can be measured with a measuring resolution of 50 to 100 µm. The probe can also be automatically rotated to determine the magnetic field's direction. The IC scanner can be set up for ESD or EFD immunity tests on ICs in a few simple steps.
The ICI HH500-15 L-EFT pulse magnetic field source couples fast transient pulses into an IC (open die) via a magnetic field. This allows for testing the immunity of individual areas of the IC. Side channel attacks can be simulated to test security-critical circuits.
Special features include a very high resolution 500 μm probe tip (allowing for the testing of extremely small areas) and a very low
trigger pulse jitter (allowing for the disruption of very specific points in the program sequence).
The ICI 03 L-EFT set include ICI I900 L-EFT Pulse Current Probe (FBBI). The pulse current source couples fast transient pulses into a test IC (Forward body biased injection). This source allows for side channel analysis or testing the immunity of individual areas of the IC.
Langer EMV-Technik GmbH
Noethnitzer Hang 31
Phone: +49 351 4300930
Fax: +49 351 93009322
Compliance Direction International Ltd.
No.10 Mansion, J6 Creative Industries Park, No.6 Jiangjun Avenue, Jiangning District,
Nanjing, Jiangsu 211111
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